La Perfilometría Óptica como Técnica de Caracterización Topográfica no Destructiva y sin Contacto

A characterization technique is the entire set of procedures and resources that science uses to study physical, chemical and structural properties in an objective, rational, systematic and reliable way. The unstoppable advance of science demands advanced techniques to obtain fast and accurate knowledge of the world around us. In this work, optical profilometry is presented as a non-destructive and non-contact technique as an alternative or complementary to other surface characterization techniques such as Scanning Electron Microscopy (SEM) or Atomic Force Microscopy (AFM). Furthermore, some examples of the utility of this technique in the development of new polymeric materials are illustrated.